diurno
Número:
M580
Data:
01/01/2001
N.º Despacho/Portaria:
9220/2012
Data:
09/07/2012
| 1º Ano | ||
|---|---|---|
| Unidade curricular | Período | ECTS |
| Industrial Automation and Control | 1st Semester | |
| Computational Tools for Instrumentation and Metrology | 1st Semester | |
| Applied instrumentation | 1st Semester | |
| Industrial Robotics | 1st Semester | |
| Project Management (optional) | 1st Semester | |
| Business Administration (optional) | 1st Semester | |
| Quality Tools (optional) | 1st Semester | |
| Materials Characterization and Metrology | 2st Semester | |
| Instrumentation and Metrology in Nanotechnology | 2st Semester | |
| Applied metrology | 2st Semester | |
| Instrumentation Seminar | 2st Semester | |
| Experimental Statistics and Data Analysis (optional) | 2st Semester | |
| Reliability and Maintenance (optional) | 2st Semester | |
| Operations Research (optional) | 2st Semester | |
| 2º Ano | ||
| Unidade curricular | Período | ECTS |
| Image Metrology | 1st Semester | |
| Metrology Seminar | 1st Semester | |
| CT and MRI Systems | 1st Semester | |
| Thesis / Project / Internship | Annual | |
